![SN74BCT8244ANT SN74BCT8244ANT](https://mm.digikey.com/Volume0/opasdata/d220001/medias/images/376/24-Dip.jpg)
SN74BCT8244ANT Texas Instruments
![sn54bct8244a.pdf](/images/adobe-acrobat.png)
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
auf Bestellung 6630 Stücke:
Lieferzeit 10-14 Tag (e)
Anzahl | Preis ohne MwSt |
---|---|
50+ | 9.78 EUR |
Produktrezensionen
Produktbewertung abgeben
Technische Details SN74BCT8244ANT Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Buffers, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.
Weitere Produktangebote SN74BCT8244ANT
Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis ohne MwSt |
---|---|---|---|---|---|
![]() |
SN74BCT8244ANT | Hersteller : Texas Instruments |
![]() Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Buffers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
Produkt ist nicht verfügbar |