SN74ABT8952DWR Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEVICE 28SOIC
Packaging: Bulk
Package / Case: 28-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Registered Bus Transceiver
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-SOIC
Part Status: Obsolete
auf Bestellung 2000 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Preis ohne MwSt |
|---|---|
| 51+ | 9.78 EUR |
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Technische Details SN74ABT8952DWR Texas Instruments
Description: IC SCAN TEST DEVICE 28SOIC, Packaging: Tape & Reel (TR), Package / Case: 28-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Registered Bus Transceiver, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-SOIC, Part Status: Obsolete.
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SN74ABT8952DWR | Hersteller : Texas Instruments |
Scan Test Device -40C to 85C 28-Pin SOIC T/R |
Produkt ist nicht verfügbar |
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SN74ABT8952DWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE 28SOIC Packaging: Tape & Reel (TR) Package / Case: 28-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Registered Bus Transceiver Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-SOIC Part Status: Obsolete |
Produkt ist nicht verfügbar |