Technische Details SNJ54BCT8240AJT TI
Description: SCAN TEST DEVICES WITH OCTAL BUF, Packaging: Tube, Package / Case: 24-CDIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Inverting Buffers, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-CDIP.
Weitere Produktangebote SNJ54BCT8240AJT
| Foto | Bezeichnung | Hersteller | Beschreibung |
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SNJ54BCT8240AJT | Hersteller : Texas Instruments |
 Scan Test Device -40C to 85C 24-Pin CDIP Tube |
Produkt ist nicht verfügbar |
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SNJ54BCT8240AJT | Hersteller : Texas Instruments |
Description: SCAN TEST DEVICES WITH OCTAL BUF Packaging: Tube Package / Case: 24-CDIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Inverting Buffers Operating Temperature: -55°C ~ 125°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-CDIP |
Produkt ist nicht verfügbar |