SNJ54BCT8240AFK Texas Instruments
Hersteller: Texas InstrumentsDescription: SCAN TEST DEVICES WITH OCTAL BUF
Packaging: Tube
Package / Case: 28-CLCC
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: -55°C ~ 125°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-LCCC (11.43x11.43)
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Technische Details SNJ54BCT8240AFK Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL BUF, Packaging: Tube, Package / Case: 28-CLCC, Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Inverting Buffers, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-LCCC (11.43x11.43).