SN74ABT8952DL Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN-TEST-DEV/XCVR 28-SSOP
Packaging: Tube
Package / Case: 28-BSSOP (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Registered Bus Transceiver
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-BSSOP
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Technische Details SN74ABT8952DL Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 28-SSOP, Packaging: Tube, Package / Case: 28-BSSOP (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Registered Bus Transceiver, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-BSSOP.